IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and testing of a sliding-window protocol in a protocol testing system

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Xiaodong Xie ; Menghui Zheng ; Kassabian, D. ; Albicki, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343291
Regular:

This paper reports on the design, development and testing of a protocol testing system recently developed at the University of Rochester. A case study of a modified Go-Back-N protocol and the... View More

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