IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault tolerance properties of mesh-connected parallel computers with separable row/column buses

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Parhami, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343286
Regular:

A two-dimensional processor array with separable row/column buses that are logically divisible into a number of local buses has proven quite effective for a wide class of parallel computations.... View More

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