IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel scheme for optimal edge detection and generic recognition

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Ben-Arie, J. ; Rao, K.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343215
Regular:

Expansion matching is a template recognition scheme which optimizes a new similarity measure called Discriminative Signal to Noise Ratio (DSNR) and has been shown to robustly recognize templates... View More

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