IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of fault-tolerance in a class of multistage interconnection networks

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Seung-Woo Seo ; Tse-Yun Feng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343120
Regular:

Some fault-tolerance properties in a class of 2log/sub 2/N- or (2log/sub 2/N-1)-stage rearrangeable network are analyzed. The analysis is based on the newly developed inside-out routing algorithm.... View More

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