IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnosability of discrete event systems and its applications to circuit testing

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Feng Lin ; Lin, T.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343039
Regular:

As man-made systems become more and more complex, diagnostics of component failures is no longer an easy task that can be performed based on experience and intuition. Therefore, it is important to... View More

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