IEEE - Institute of Electrical and Electronics Engineers, Inc. - The testability of a reconfigurable fault-tolerant system

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Barbour, A.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343021
Regular:

The testability of a new form of dynamic redundancy technique which uses the reconfigurability property of a voting device, called a two-level error masking circuit, 2-EMC, is investigated. The... View More

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