IEEE - Institute of Electrical and Electronics Engineers, Inc. - The module orientation problem based on Manhattan wire measure is still NP-complete [VLSI design]

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Jin-Tai Yan ; Pei-Yung Hsiao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343004
Regular:

In this paper, Manhattan measure of distance is used to estimate the length of routing nets, and the module orientation problem based on Manhattan measure is proposed. According to the geometrical... View More

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