IEEE - Institute of Electrical and Electronics Engineers, Inc. - Berger code self-testing checkers with partitioning and folding scheme

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Chia-Shun Lai ; Chin-Long Wey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.343003
Regular:

Due to the salient feature of the least redundant separable codes, Berger codes have been implemented for fault-tolerant, fail-safe, and concurrent error testable designs of digital circuits and... View More

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