IEEE - Institute of Electrical and Electronics Engineers, Inc. - A robustness measure for hypercube networks

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Latifi, S. ; Rai, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.342988
Regular:

This paper addresses a constrained two-terminal reliability measure referred to as Distance Reliability (DR) between two nodes s and t of Hamming distance H(s,t). in hypercube networks (B/sub n/).... View More

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