IEEE - Institute of Electrical and Electronics Engineers, Inc. - NEUDEM: neural network based decision making for generating tests in digital circuits

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Rai, S. ; Johnson, H.L. ; Ratnam, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.342975
Regular:

The paper presents a neural network based automatic test pattern generation methodology for combinational circuits. We consider 2- and 3- valued Hopfield models to describe basic gates such as... View More

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