IEEE - Institute of Electrical and Electronics Engineers, Inc. - Final value of aliasing error probability for transition counting

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Seireg, R.H. ; Vacroux, A.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.342955
Regular:

The Aliasing Error Probability (AEP) is the most important parameter for evaluation of any compaction method. The general formula for AEP was deduced for the transition counting technique under... View More

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