IEEE - Institute of Electrical and Electronics Engineers, Inc. - The effect of FIB technology on design methodology

Proceedings of 36th Midwest Symposium on Circuits and Systems

Author(s): Moon-Yee Wang ; Lee, S.X. ; Shiyan Pei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Detroit, MI, USA
Conference Date: 16 August 1993
ISBN (Paper): 0-7803-1760-2
DOI: 10.1109/MWSCAS.1993.342945
Regular:

The applications of focused-ion-beam (FIB) in integrated circuit (IC) modifications are discussed. The capabilities and characteristics of this technology along with the practical examples are... View More

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