IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrical Impedance Computed Tomography -algorithms And Applications

1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference

Author(s): Mu, Z. ; Wexler, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 31 October 1993
Page(s): 1,302 - 1,306
ISBN (Paper): 0-7803-1487-5
DOI: 10.1109/NSSMIC.1993.701850
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