IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scatter Correction In Single-photon Imaging Using Multiple Energy Bins And Minimum-risk Estimators

1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference

Author(s): Haynor, D.R. ; Kaplan, M.S. ; O'Sullivan, F.S. ; Miyaoka, R.M. ; Pollard, K.R. ; Harrison, R.L. ; Lewellen, T.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 31 October 1993
Page(s): 1,159 - 1,163
ISBN (Paper): 0-7803-1487-5
DOI: 10.1109/NSSMIC.1993.701829
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