IEEE - Institute of Electrical and Electronics Engineers, Inc. - High Speed Pipelined Pattern Recognition

1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference

Author(s): Fordham, C. ; Ali, I. ; Behrens, B. ; Foudas, C. ; Goussiou, A. ; Jaworski, M. ; Silverstein, S. ; Smith, W.H. ; Wisconsin, U. ; Dawson, J. ; Krakauer, D. ; Talaga, R.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 31 October 1993
Page(s): 832 - 834
ISBN (Paper): 0-7803-1487-5
DOI: 10.1109/NSSMIC.1993.701764
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