IEEE - Institute of Electrical and Electronics Engineers, Inc. - Worst-case sampling for sampled-data H/sub /spl infin// design

Proceedings of 32nd IEEE Conference on Decision and Control

Author(s): Toivonen, H.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Antonio, TX, USA
Conference Date: 15 December 1993
ISBN (Paper): 0-7803-1298-8
DOI: 10.1109/CDC.1993.325135
Regular:

Worst-case sampling of continuous-time systems is studied. The procedure generates a finite-dimensional discrete system with the property that for any discrete control law, the L/sub 2/-induced... View More

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