IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new metric for stability robustness

Proceedings of 32nd IEEE Conference on Decision and Control

Author(s): Quan Liang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Antonio, TX, USA
Conference Date: 15 December 1993
ISBN (Paper): 0-7803-1298-8
DOI: 10.1109/CDC.1993.325091
Regular:

This paper seeks to combine two concepts in mathematics, namely, arcwise connectivity and subspace gap, and propose a new metric for stability robustness analysis of linear time-invariant... View More

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