IEEE - Institute of Electrical and Electronics Engineers, Inc. - Worst-case /spl Lscr//sub 1/ identification using mixed parametric-nonparametric models

Proceedings of 32nd IEEE Conference on Decision and Control

Author(s): Elia, N. ; Milanese, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Antonio, TX, USA
Conference Date: 15 December 1993
ISBN (Paper): 0-7803-1298-8
DOI: 10.1109/CDC.1993.325088
Regular:

In this paper we study the problem of identifying a system within a given class, using input-output measurements corrupted by /spl Lscr//sub /spl infin// bounded noise. The identification error is... View More

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