IEEE - Institute of Electrical and Electronics Engineers, Inc. - Monitoring techniques for RISC embedded systems

Proceedings of NAECON '93 - National Aerospace and Electronics Conference

Author(s): Jundi, K. ; Moon, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Dayton, OH, USA
Conference Date: 24 May 1993
ISBN (Paper): 0-7803-1295-3
DOI: 10.1109/NAECON.1993.290970
Regular:

As embedded computer systems become more advanced and more complex, monitoring the performance of microprocessors incorporated into those systems also become more difficult. Most of the embedded... View More

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