IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transfer function method for diagnostics of electronic circuit boards exposed to mechanical vibrations

Proceedings of NAECON '93 - National Aerospace and Electronics Conference

Author(s): Skormin, V.A. ; Plaskon, S.L. ; Popyack, L.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Dayton, OH, USA
Conference Date: 24 May 1993
ISBN (Paper): 0-7803-1295-3
DOI: 10.1109/NAECON.1993.290958
Regular:

Environmental stress plays a critical role in failure and long term reliability of aerospace electronics. Vibration monitoring can provide information characterizing the structural integrity of a... View More

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