IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performing the AVIP durability analysis using the finite element method

Proceedings of NAECON '93 - National Aerospace and Electronics Conference

Author(s): Trembinski, T. ; Reganato, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Dayton, OH, USA
Conference Date: 24 May 1993
ISBN (Paper): 0-7803-1295-3
DOI: 10.1109/NAECON.1993.290848
Regular:

Improving avionics hardware reliability through the use of durability analysis is a primary objective of the U.S. Air Force Aeronautical Systems Division's Avionics Integrity Program (AVIP).... View More

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