IEEE - Institute of Electrical and Electronics Engineers, Inc. - Virtual Test Station (VTS)

Proceedings of NAECON '93 - National Aerospace and Electronics Conference

Author(s): Walters, S.A. ; Stephenson, M.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Dayton, OH, USA
Conference Date: 24 May 1993
ISBN (Paper): 0-7803-1295-3
DOI: 10.1109/NAECON.1993.290812
Regular:

The Wright Laboratory, Avionics Logistics Branch (WL/AAAF) has been conducting research to reduce development and support costs while drastically improving the capability of simulators used to... View More

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