IEEE - Institute of Electrical and Electronics Engineers, Inc. - Asset recovery via automated test and analysis

Proceedings of NAECON '93 - National Aerospace and Electronics Conference

Author(s): K.C. Craig, J. ; P. Greenman
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Dayton, OH, USA, USA
Conference Date: 24 May 1993
ISBN (Paper): 0-7803-1295-3
DOI: 10.1109/NAECON.1993.290811
Regular:

High power traveling wave tubes (TWTs) used in airborne electronic warfare systems are expensive and have posed a persistent logistics challenge. We discuss prototype design for the TWT automated... View More

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