IEEE - Institute of Electrical and Electronics Engineers, Inc. - The DESC field failure evaluation program "a cradle to grave approach"

Proceedings of NAECON '93 - National Aerospace and Electronics Conference

Author(s): Lantz, B.A. ; McNicholl, B.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Dayton, OH, USA
Conference Date: 24 May 1993
ISBN (Paper): 0-7803-1295-3
DOI: 10.1109/NAECON.1993.290802
Regular:

This paper describes the Defense Electronics Supply Center's field failure evaluation program and the results achieved. The primary objective of the program is to take positive corrective action... View More

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