IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Automated SONOS NVSM Dynamic Characterization System

1993 Nonvolatile Memory Technology Review

Author(s): Banerjee, A.K. ; Yin Hu ; Martin, M.G. ; White, M.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Linthicum Heights, MD, USA
Conference Date: 22 June 1993
Page(s): 78 - 81
ISBN (Paper): 0-7803-1290-2
DOI: 10.1109/NVMT.1993.696957
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