IEEE - Institute of Electrical and Electronics Engineers, Inc. - On The Total Dose Radiation Hardness Of Floating Gate EEPROM Cells

1993 Nonvolatile Memory Technology Review

Author(s): Wellekens, D. ; Groeseneken, G. ; Van Houdt, J. ; Maes, H.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Linthicum Heights, MD, USA
Conference Date: 22 June 1993
Page(s): 74 - 77
ISBN (Paper): 0-7803-1290-2
DOI: 10.1109/NVMT.1993.696956
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