IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temperature Transients In Normal And Giant Magneto-resistance Memory Cells

1993 Nonvolatile Memory Technology Review

Author(s): Pohm, A.V. ; Comstock, C.S. ; Kohl, C.E. ; Ranrnuthu, I. ; Ranmuthu, K.T.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Linthicum Heights, MD, USA
Conference Date: 22 June 1993
Page(s): 5 - 7
ISBN (Paper): 0-7803-1290-2
DOI: 10.1109/NVMT.1993.696936
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