Association for Computing Machinery (ACM) - Design for Testability for Path Delay Faults in Sequential Circuits

30th ACM/IEEE Design Automation Conference

Author(s): T.J. Chakraborty ; V.D. Agrawal ; M.L. Bushnell
Publisher: Association for Computing Machinery (ACM)
Publication Date: 1 January 1993
Conference Location: Dallas, TX, USA, USA
Conference Date: 14 June 2014
Page(s): 453 - 457
ISBN (Paper): 0-89791-577-1
ISSN (Paper): 0738-100X
DOI: 10.1145/157485.164973
Regular:

We experimentally study the reasons for low coverage of path delay faults in several sequential benchmark circuits. Causes for undetected faults are classified into three categories: (A)... View More

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