Association for Computing Machinery (ACM) - INCREDYBLE-TG: INCREmental DYnamic Test Generation Based on LEarning

30th ACM/IEEE Design Automation Conference

Author(s): I. Pomeranz ; S.M. Reddy
Publisher: Association for Computing Machinery (ACM)
Publication Date: 1 January 1993
Conference Location: Dallas, TX, USA, USA
Conference Date: 14 June 2014
Page(s): 80 - 85
ISBN (Paper): 0-89791-577-1
ISSN (Paper): 0738-100X
DOI: 10.1145/157485.164583

A new test generation approach is proposed for circuits having a a size parameter (e.g., operand size), that can be varied to obtain designs of different sizes. Under this approach, test... View More