IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental evidence of sensitivity analysis predicting minimum failure probabilities

Proceedings of COMPASS '93 - IEEE 8th Annual Conference on Computer Assurance: Practical Paths to Assurance

Author(s): Voas, J.M. ; Payne, J.E. ; Michael, C.C. ; Miller, K.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Gaithersburg, MD, USA, USA
Conference Date: 14 June 1993
Page(s): 123 - 133
ISBN (Paper): 0-7803-1251-1
DOI: 10.1109/CMPASS.1993.288851
Regular:

The authors discuss a theoretical statistical technique complementary to black-box testing, called sensitivity analysis. Black-box testing establishes an upper limit on the likely probability of... View More

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