IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of cloud optical thickness and effective radius retrievals for broken cloud fields

Proceedings of IGARSS '93 - IEEE International Geoscience and Remote Sensing Symposium

Author(s): Feind, R.E. ; Welch, R.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Tokyo, Japan
Conference Date: 18 August 1993
ISBN (Paper): 0-7803-1240-6
DOI: 10.1109/IGARSS.1993.322744
Regular:

Radiative transfer model results at two wavelengths (i.e., visible and near IR) can be applied to satellite imagery to infer optical properties of clouds. In this study, the authors examine... View More

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