IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fractal Brownian Model for SAR image analysis: edge detection and classification issues

Proceedings of IGARSS '93 - IEEE International Geoscience and Remote Sensing Symposium

Author(s): Migliaccio, M. ; Riccio, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Tokyo, Japan
Conference Date: 18 August 1993
ISBN (Paper): 0-7803-1240-6
DOI: 10.1109/IGARSS.1993.322448
Regular:

Feature analysis is used to explore and improve SAR imagery and it is therefore of great relevance. In this paper, the Fractal Brownian Model for SAR image edge detection and classification is... View More

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