IEEE - Institute of Electrical and Electronics Engineers, Inc. - Processing and validation of ERS-1 scatterometer data at the Italian PAF

Proceedings of IGARSS '93 - IEEE International Geoscience and Remote Sensing Symposium

Author(s): Bartoloni, A. ; D'Amelio, C. ; Nirchio, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Tokyo, Japan
Conference Date: 18 August 1993
ISBN (Paper): 0-7803-1240-6
DOI: 10.1109/IGARSS.1993.322423
Regular:

The results of the I-PAF scatterometer data processing chain on two different data sets are shown and analyzed; in particular the problems arising from data measured over closed areas such as the... View More

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