IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of GIS on exploration of the strikes and dips of buried faults

Proceedings of IGARSS '93 - IEEE International Geoscience and Remote Sensing Symposium

Author(s): Changhua Cen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Tokyo, Japan
Conference Date: 18 August 1993
ISBN (Paper): 0-7803-1240-6
DOI: 10.1109/IGARSS.1993.322348
Regular:

Buried faults have drawn more and more attention of geologists by their important geological significance in structural geology and in engineering geology. But how to identify their existence and... View More

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