IEEE - Institute of Electrical and Electronics Engineers, Inc. - Daily reliability dispatch of generating units

Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation

Author(s): Lan Qinghua ; Ren Zhen ; Ran Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Beijing, China, China
Conference Date: 19 October 1993
Volume: 5
Page Count: 5
ISBN (Paper): 0-7803-1233-3
DOI: 10.1109/TENCON.1993.320574
Regular:

In accordance with a new viewpoint of operating risk, probabilistic power system unit commitment is studied in this paper. The proposed approach takes the unit stochastic failure characteristics... View More

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