IEEE - Institute of Electrical and Electronics Engineers, Inc. - An experimental electrical impedance tomography system

Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation

Author(s): R.C.V. Tai ; H.R. Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Beijing, China, China
Conference Date: 19 October 1993
Volume: 2
Page Count: 4
ISBN (Paper): 0-7803-1233-3
DOI: 10.1109/TENCON.1993.320183
Regular:

The design of an experimental electrical impedance tomography (EIT) system is presented. The aim of EIT is to reconstruct the internal resistance distribution of a test object (region). The... View More

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