IEEE - Institute of Electrical and Electronics Engineers, Inc. - Gray-level-based corner detection by using wavelet transform

Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation

Author(s): Jiann-Shu Lee ; Yung-Nien Sun ; Chin-Hsing Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Beijing, China, China
Conference Date: 19 October 1993
Volume: 2
Page Count: 4
ISBN (Paper): 0-7803-1233-3
DOI: 10.1109/TENCON.1993.320175
Regular:

Corners are very attractive features for many applications in computer vision. In this paper, a novel gray-level corner detection algorithm based on the wavelet transform is presented. First, we... View More

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