IEEE - Institute of Electrical and Electronics Engineers, Inc. - An approach to diagnosing multiple procedural faults

Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation

Author(s): Zhongping Huang ; Naoyuki Tokuda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Beijing, China, China
Conference Date: 19 October 1993
Volume: 1
Page Count: 4
ISBN (Paper): 0-7803-1233-3
DOI: 10.1109/TENCON.1993.319979
Regular:

In diagnosing incorrect results arising from faulty procedures we are required to indicate not only types but also locations of the faults involved. It is relatively easy to simulate the procedure... View More

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