IEEE - Institute of Electrical and Electronics Engineers, Inc. - An approximation network for measurement systems

Proceedings of 1993 IEEE International Conference on Neural Networks (ICNN '93)

Author(s): Zaremba, M.B. ; Porada, E. ; Bock, W.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 28 March 1993
ISBN (Paper): 0-7803-0999-5
DOI: 10.1109/ICNN.1993.298815
Regular:

The problem of extraction of the measured value in optical measurement systems is addressed. It is required that the values of the calibration points be recreated exactly, while maintaining... View More

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