IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inherent fault tolerance analysis for a class of multi-layer neural networks with weight deviations

Proceedings of 1993 IEEE International Conference on Neural Networks (ICNN '93)

Author(s): Yang, X. ; Chen, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 28 March 1993
ISBN (Paper): 0-7803-0999-5
DOI: 10.1109/ICNN.1993.298700
Regular:

The general formula of computing the deviation of the output of a multilayer neural network (MLNN) with respect to the deviations of its input and of its weights is presented. The upper bound of... View More

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