IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fault tolerant optimal interpolative net

Proceedings of 1993 IEEE International Conference on Neural Networks (ICNN '93)

Author(s): Simon, D. ; El-Sherief, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 28 March 1993
ISBN (Paper): 0-7803-0999-5
DOI: 10.1109/ICNN.1993.298665
Regular:

The optimal interpolative (OI) classification network is extended to include fault tolerance and make the network more robust to the loss of a neuron. The OI Net has the characteristic that the... View More

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