IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptive k-means algorithm with error-weighted deviation measure

Proceedings of 1993 IEEE International Conference on Neural Networks (ICNN '93)

Author(s): Chinrungrueng, C. ; Sequin, C.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 28 March 1993
ISBN (Paper): 0-7803-0999-5
DOI: 10.1109/ICNN.1993.298627
Regular:

The k-means algorithm can be used in multi-module networks to partition the input domain of supervised learning problems. The traditional k-means algorithm partitions the input domain based solely... View More

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