IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 1/2-in 380 k-pixel progressive scan CCD image sensor

Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '93

Author(s): Kobayashi, A. ; Naito, Y. ; Ishigami, T. ; Izumi, A. ; Hanagata, T. ; Nakashima, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 24 February 1993
Page(s): 192 - 193
ISBN (Paper): 0-7803-0987-1
DOI: 10.1109/ISSCC.1993.280052
Regular:

A progressive-scan interline-transfer CCD (charge coupled device) image sensor (PS-CCD) that can read out vertical signal packets without mixing is presented. It can solve ill-matched resolutions.... View More

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