IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 12.5 Gb/s Si bipolar IC for PRBS generation and bit error detection up to 25 Gb/s

Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '93

Author(s): Bussmann, M. ; Langmann, U. ; Hillery, B. ; Brown, W.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 24 February 1993
Page(s): 152 - 153
ISBN (Paper): 0-7803-0987-1
DOI: 10.1109/ISSCC.1993.280033
Regular:

Reliable testing at multi-Gb/s frequencies has become a major issue in the development of high-speed optical fiber communication systems and components. According to CCITT recommendation O.151,... View More

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