IEEE - Institute of Electrical and Electronics Engineers, Inc. - A multiple frame-interline-transfer (M-FIT) CCD for progressive-scan camera systems

Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '93

Author(s): Itakura, K. ; Nobusada, T. ; Toyoda, Y. ; Saitoh, Y. ; Kokusenya, N. ; Nagayoshi, R. ; Ozaki, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 24 February 1993
Page(s): 190 - 191
ISBN (Paper): 0-7803-0987-1
DOI: 10.1109/ISSCC.1993.280002
Regular:

A progressive scan CCD (charge coupled device) that features multiple-frame interline transfer (M-FIT) operation is described. This 2/3-inch 500-k (948*486)-pixel M-FIT CCD is implemented on the... View More

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