IEEE - Institute of Electrical and Electronics Engineers, Inc. - Component tolerance and circuit performance: a case study

Proceedings of IEEE Applied Power Electronics Conference APEC '93

Author(s): White, R.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Diego, CA, USA
Conference Date: 7 March 1993
Page(s): 922 - 927
ISBN (Paper): 0-7803-0983-9
DOI: 10.1109/APEC.1993.290679
Regular:

The author presents a continuation of work presented at APEC 1992 (see p.28-35), in which a simple circuit was simulated to predict yield in the manufacturing process. The simulation results had... View More

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