IEEE - Institute of Electrical and Electronics Engineers, Inc. - Snow Properties Derived From TM And SAR Measurements

Proceedings of IEEE Topical Symposium on Combined Optical, Microwave, Earth and Atmosphere Sensing

Author(s): Jiancheng Shi ; Dozier, J. ; Rosenthal, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Albuquerque, NM, USA
Conference Date: 22 March 1994
Page(s): 240 - 243
ISBN (Paper): 0-7803-0969-3
DOI: 10.1109/COMEAS.1993.700230
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