IEEE - Institute of Electrical and Electronics Engineers, Inc. - Retrieval Of Surface Physical Parameters With AVHRR And SMMR Over Africa

Proceedings of IEEE Topical Symposium on Combined Optical, Microwave, Earth and Atmosphere Sensing

Author(s): Qi, J. ; Kerr, Y. ; Huete, A.R. ; Sorooshian, S. ; Dedieu, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Albuquerque, NM, USA
Conference Date: 22 March 1994
Page(s): 96 - 99
ISBN (Paper): 0-7803-0969-3
DOI: 10.1109/COMEAS.1993.700193
Advertisement