IEEE - Institute of Electrical and Electronics Engineers, Inc. - Long Slit Spectroscopy In The Ten Micron Infrared As A Tool For Remote Sensing

Proceedings of IEEE Topical Symposium on Combined Optical, Microwave, Earth and Atmosphere Sensing

Author(s): LeVan, P.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Albuquerque, NM, USA
Conference Date: 22 March 1994
Page(s): 28 - 30
ISBN (Paper): 0-7803-0969-3
DOI: 10.1109/COMEAS.1993.700172
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