IEEE - Institute of Electrical and Electronics Engineers, Inc. - Further result on 2-D stability test via 1-D stability robustness analysis

Proceedings of ICASSP '93

Author(s): Lu, H.-C. ; Yeh, K.-S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Minneapolis, MN, USA, USA
Conference Date: 27 April 1993
Volume: 5
ISBN (Paper): 0-7803-7402-9
ISSN (Paper): 1520-6149
DOI: 10.1109/ICASSP.1993.319860
Regular:

A stability analysis tool for 2-D systems using the eigenvalue sensitivity of the matrix is presented. The 2-D system stability test is based on 1-D system robust stability analysis with unequal... View More

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